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    Columbia Campus
   
 
  Jun 07, 2025
 
2014-2015 Graduate Studies Bulletin 
  
2014-2015 Graduate Studies Bulletin [Archived Catalog]

ELCT 774 - Advanced Semiconductor Characterization.|

Credits: 3

Advanced semiconductor material characterization; Hall effect and mobility measurements, optical characterization, scanning probe microscopy, electron microscopy, X-Ray diffraction techniques; nanoscale characterization techniques.

Prerequisites: ELCT 574